A microcantilever-based system for measuring surface stress changes induced in thin films by electrochemical reactions
Tabard-Cossa Vincent, Godin Michel, Beaulieu L Y, Badia Antonella, Grutter Peter
APS March Meeting Abstracts(2004)K1 - 130
Citation
Tabard-Cossa, V., Godin, M., Beaulieu, L. Y., Badia, A., & Grutter, P. (2004). A microcantilever-based system for measuring surface stress changes induced in thin films by electrochemical reactions. APS March Meeting Abstracts, 2004, K1-130.